We are thrilled to announce that Prof. Ivo Ihrke from the University of Siegen, Germany, will be delivering a keynote talk at the Second European Light Field Imaging Workshop (ELFI 2024).
In his presentation titled “4D Aspects of Computational Microscopy: Vignetting, Aberrations, Rays and Waves,” Prof. Ihrke will delve into the fascinating realm of optical imaging, exploring often-overlooked 4D effects. Drawing from his extensive expertise and research, he will shed light on joint field and pupil-dependent effects, offering valuable insights into the intricate connections between wave and ray pictures of image formation.
Prof. Ihrke’s distinguished career encompasses various aspects of computational imaging, including theory, mathematical modeling, algorithm design, and hardware concepts. Attendees can anticipate gaining invaluable knowledge on interpreting aberrations and radiometric properties of optical systems from his presentation. For further details on this session and other presentations, please visit the Invited Talks page.